AFM IN SITU
Next level of images
Atomic force microscope
designed for easy integration
in electron microscopes
sweep
Added values
Complex sample analysis
Unique multidimensional correlative imaging technology enables simultaneous acquisition of SEM and AFM data, and their seamless correlation to 3D images.
On-site conditions
All measurements are performed at the same time, in the same place and under the same conditions, avoiding the need for sample transfer and the risk of contamination during analysis.
Precise localization of the region of interest
Extremely precise and time-saving focus using SEM to locate and navigate the AFM to the region of interest.
Profits
Improved SEM capabilities
AFM in SEM enhances the capabilities of both techniques, allowing analysis of complex samples for electrical, mechanical, and magnetic properties within SEM.
Maximum accuracy of correlative images
Unique Correlative Probe Electron Microscopy ( CPEM ) technology enables simultaneous acquisition and correlation of chosen SEM and AFM channels.
Quick and easy location of the region of interest
SEM helps to quickly locate the region of interest and accurately navigate the AFM tip.
On-site analysis: no risk of sample contamination
In Situ conditions within the SEM ensure analysis of samples at the same time, in the same place, and under the same conditions.
2D to 3D SEM Image Extension
The contrast of the SEM material is enhanced by information about sub-nanometric 3D topography and roughness.
