Differentiated 4D-STEM performance

The performance of TESCAN TENSOR's 4D-STEM capabilities is supported by ultra-fast and accurate scanning synchronization with (direct electron) diffraction imaging, EDS acquisition, electron beam precession, beam blanking, and real-time analysis and processing. of the acquired data.

This has been possible by integrating state-of-the-art components and techniques "from scratch":



Hybrid pixel, Direct Electron Detection (DED) Near-ultrahigh vacuum within sample area (near UHV) Precessing Electron Diffraction (PED) Integrated, fast beam blanking Windowless, symmetrical, solid wide-angle EDS 4D analysis and processing -STEM in real time (Explore)

TESCAN TENSOR: A STEM as easy to use as a SEM

Scientists, engineers, technicians, and students have long wanted a TEM solution that is easily usable without weeks or months of training in non-productive electro-optical alignments and adjustments. TESCAN TENSOR allows you to spend your time at the microscope interacting with your sample, rather than with the optics. This is accomplished by implementing “measurements” with preset optical properties, such as beam current, convergence angle, spot size, and precession on or off, automatically adjusted and aligned.

The result: an analytical 4D-STEM that is as easy to use as TESCAN SEMs, with all the efficiency and economic benefits of a results-based electron microscope.



This approach can also generate economic benefits, such as better accessibility for novice users, leading to increased tool utilization and supporting return on investment.